Okuma Listesi |
Thin Film Analysis by X-Ray Scattering, Mario Birkholz, WILEY-VCH Verlag GmbH & Co. KGaA; High-Resolution X-Ray Scattering from Thin Films and Multilayers, Vaclav Holy, Ullrich Pietsch, Tilo Baumbach, Springer; X-Ray Scattering from Semiconductors, Paul F Fewster, Imperial College Press |