Okuma Listesi |
X-ray diffraction by polycrystalline materials / René Guinebretière. 2007, Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster Weinheim : Wiley-VCH, c2006.Semiconductor physics and devices : basic principles / Donald A. Neaman. New York : Mc-Graw-Hill, 2012.Basic Principles of Spectroscopy, Raymond Chang, McGraw-Hill Book Company, 1971. |