| Code - Course Title |
FİZ540 - Characterization of Solids |
| Course Type |
Elective Courses |
| Language of Instruction |
Türkçe |
| Laboratory + Practice |
3+0 |
| ECTS |
7.5 |
| Course Instructor(s) |
PROFESÖR DOKTOR TÜLAY HURMA |
| Mode of Delivery |
The mode of delivery of this course is Face- to- Face |
| Prerequisites |
There is no prerequisite or co-requisite for this course. |
| Courses Recomended |
There is no recommended optional programme component for this course. |
| Required or Recommended Resources |
X-ray diffraction by polycrystalline materials / René Guinebretière. 2007, Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster Weinheim : Wiley-VCH, c2006.Semiconductor physics and devices : basic principles / Donald A. Neaman. New York : Mc-Graw-Hill, 2012.Basic Principles of Spectroscopy, Raymond Chang, McGraw-Hill Book Company, 1971. |
| Recommended Reading List |
X-ray diffraction by polycrystalline materials / René Guinebretière. 2007, Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster Weinheim : Wiley-VCH, c2006.Semiconductor physics and devices : basic principles / Donald A. Neaman. New York : Mc-Graw-Hill, 2012.Basic Principles of Spectroscopy, Raymond Chang, McGraw-Hill Book Company, 1971. |
| Assessment methods and criteria |
1 midterm Exam 1 Homework 1 Final Exam |
| Work Placement |
Not Applicable |
| Sustainability Development Goals |
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