Akademik Dersler - Tanıtım


Code - Course Title	FİZ540 - Characterization of Solids
Course Type	Elective Courses
Language of Instruction	Türkçe
Laboratory + Practice	3+0
ECTS	7.5
Course Instructor(s)	PROFESÖR TÜLAY HURMA
Mode of Delivery	The mode of delivery of this course is Face- to- Face
Prerequisites	There is no prerequisite or co-requisite for this course.
Courses Recomended	There is no recommended optional programme component for this course.
Recommended Reading List	X-ray diffraction by polycrystalline materials / René Guinebretière. 2007, Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster Weinheim : Wiley-VCH, c2006.Semiconductor physics and devices : basic principles / Donald A. Neaman. New York : Mc-Graw-Hill, 2012.Basic Principles of Spectroscopy, Raymond Chang, McGraw-Hill Book Company, 1971.
Assessment methods and criteria	1 midterm Exam 1 Homework 1 Final Exam
Work Placement	Not Applicable
Sustainability Development Goals

Weeks	Topics
Week - 1	Electromagnetic spectrum and interaction between the light and matter
Week - 2	Crystal structure, crystal planes
Week - 3	Bragg Law, X-rays
Week - 4	Structural analysis with x-ray diffraction spectroscopy
Week - 5	Structural analysis with x-ray diffraction spectroscopy
Week - 6	Surface analysis with scanning electron microscope
Week - 7	Structural analysis with transition electron microscope
Week - 8	Electrical characterization of materials
Week - 9	Photoluminescence
Week - 10	Electroluminescence
Week - 11	Electroluminescence II. Midterm
Week - 12	Magnetoresistance
Week - 13	IR, Raman
Week - 14	IR, Raman

Assessment Method and Passing Requirements
	Quamtity	Percentage (%)
Toplam (%)		0