Akademik Dersler - Tanıtım


Code - Course Title	İTN532 - X-Ray Diffraction in Analysis of Thin Films
Course Type	Elective Courses
Language of Instruction	İngilizce
Laboratory + Practice	3+0
ECTS	7.5
Course Instructor(s)	DOKTOR ÖĞRETİM ÜYESİ BURCU ARPAPAY
Mode of Delivery	Face-to-face
Prerequisites	None
Courses Recomended	None
Required or Recommended Resources	Thin Film Analysis by X-Ray Scattering, Mario Birkholz, WILEY-VCH Verlag GmbH & Co. KGaA; High-Resolution X-Ray Scattering from Thin Films and Multilayers, Vaclav Holy, Ullrich Pietsch, Tilo Baumbach, Springer; X-Ray Scattering from Semiconductors, Paul F Fewster, Imperial College Press
Recommended Reading List	Thin Film Analysis by X-Ray Scattering, Mario Birkholz, WILEY-VCH Verlag GmbH & Co. KGaA; High-Resolution X-Ray Scattering from Thin Films and Multilayers, Vaclav Holy, Ullrich Pietsch, Tilo Baumbach, Springer; X-Ray Scattering from Semiconductors, Paul F Fewster, Imperial College Press
Assessment methods and criteria	Exam, Homework
Work Placement	None
Sustainability Development Goals

Weeks	Topics
Week - 1	Crystal structures: Crystal systems, miller indices, lattice planes and directions, crystal defects
Week - 2	Semiconductor heterostructures
Week - 3	Properties of X-rays
Week - 4	Properties of X-rays
Week - 5	Summary
Week - 6	Components of X-ray diffractometer
Week - 7	Components of X-ray diffractometer
Week - 8	Rocking curve
Week - 9	Summary
Week - 10	Grazing incidence diffraction
Week - 11	X-ray reflectivity
Week - 12	Reciprocal space map
Week - 13	Applications for thin films
Week - 14	Summary

Assessment Method and Passing Requirements
	Quamtity	Percentage (%)
Toplam (%)		0