| Code - Course Title |
MLZ623 - Structural and Optical Characterization |
| Course Type |
Elective Courses |
| Language of Instruction |
Türkçe |
| Laboratory + Practice |
3+0 |
| ECTS |
7.5 |
| Course Instructor(s) |
PROFESÖR DOKTOR RAMİS MUSTAFA ÖKSÜZOĞLU |
| Mode of Delivery |
face to face |
| Prerequisites |
Having completed fundamental undergraduate and graduate courses on X-ray diffraction (XRD) techniques. Having taken undergraduate courses on the electrical and optical properties of materials. |
| Courses Recomended |
Solid State Physics, Electrical Properties of Materials, Structure of Materials |
| Required or Recommended Resources |
“Thin Film Analyses by X-Ray Scattering” by Maria Birkholz, Wiley – VCH, 2006.“Nanotechnology: Principles and Practices” 3th Edition, by Sulabha K. Kulkarni, Springer, 2015. |
| Recommended Reading List |
“Thin Film Analyses by X-Ray Scattering” by Maria Birkholz, Wiley – VCH, 2006.“Nanotechnology: Principles and Practices” 3th Edition, by Sulabha K. Kulkarni, Springer, 2015. |
| Assessment methods and criteria |
Two midterm exams, one final exam (1 project, 1 classical, 1 presentation). |
| Work Placement |
Not Applicable |
| Sustainability Development Goals |
|