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Week - 1 |
The history of transmission electron microscopes and their significance in the Nobel Prizes |
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Week - 2 |
Electron-solid interaction and its consequences |
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Week - 3 |
Components and functions of transmission electron microscopes |
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Week - 4 |
Image detectors in transmission electron microscopes (BF, DF, etc.) |
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Week - 5 |
EN: Diffraction and phase analysis (SADP and PED) in transmission electron microscopes |
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Week - 6 |
EN: Chemical analysis detectors (EDS) in transmission electron microscopes |
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Week - 7 |
EN: Scanning transmission electron microscopy (STEM) techniques (ADF, HAADF, etc.) |
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Week - 8 |
EN: EELS and energy filter |
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Week - 9 |
Other newly developed transmission electron microscope detectors (CL, SE, etc.) |
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Week - 10 |
Sample preparation techniques for transmission electron microscopy |
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Week - 11 |
In-situ analyses by transmission electron microscopy |
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Week - 12 |
Quantitative and qualitative microanalysis in TEM. |
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Week - 13 |
Problem solving in STEM-1: Research-oriented problems |
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Week - 14 |
Problem solving in STEM-2: Research-oriented problems |