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Week - 1 |
An introduction to the techniques for materials characterization |
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Week - 2 |
Scanning tunneling microscope |
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Week - 3 |
Atomic force microscopy |
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Week - 4 |
Atomic force microscopy |
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Week - 5 |
Summary |
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Week - 6 |
Optical microscopy, scanning electron microscopy |
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Week - 7 |
Scanning electron microscopy |
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Week - 8 |
Transmission electron microscopy |
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Week - 9 |
Transmission electron microscopy |
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Week - 10 |
Summary |
|
Week - 11 |
X-ray photoelectron spectroscopy |
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Week - 12 |
Secondary ion mass spectrometry |
|
Week - 13 |
Raman spectroscopy |
|
Week - 14 |
Summary |
Eskisehir Technical University Info Package 
Turkish 
English